Publication

Power Semiconductor Device Technology and Reliability

2026 Multi-Criteria Reliability Qualification on Laser Micro-Dissimilar Welding of Ultra-Thin Flexible Flat Cu Cable onto Uncoated Aluminum alloy Busbar for EV Cell Sensing

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Author
Hyunjong Yoo, Doyun Ahn, Minseok Lee, Donghyun Kim, Dongil Lee, Eunho Kim, Ik-Seon Kwon, Hyun-Seop Kim, Geum-Su Yeom, Jihun Kim, Hee-Shin Kang, Junsu Park
Journal
International Journal of Precision Engineering and Manufacturing
Vol./ Page
Vol. xx, No. xx, pp. xxx-xxx
DOI
DOI: 10.1007/s12541-026-01596-4
Year
2026