Publication

Power Semiconductor Device Technology and Reliability

2026 A 1.8-kV Normally-Off Al-rich AlGaN Channel HEMTs Featuring a Recessed Gate and Superlattice Structure

본문

Author
Jaejin Heo, Joocheol Jeong, Shyam Mohan, Hyogeun Cho, Okhyun Nam, Sakhone Pharkphoumy, and Hyun-seop Kim
Journal
IEEE Transactions on Electron Devices
Vol./ Page
Vol. 73, No. 8, pp. 5288-5292
DOI
DOI: 10.1109/TED.2026.3708421
Year
2026