2026 Dynamic RON in Short-Loop Processed AlGaN/GaN Devices: Impact of Layer Thickness
본문
- Author
- Hyun-Seop Kim, Michael J. Uren, Chaowang Liu, Andrew Withey, Robert Harper, Sam Evans, Martin Kuball
- Journal
- IEEE Transactions on Electron Devices
- Vol./ Page
- Vol. 73, No. 7, pp. 3942-3948
- DOI
- DOI: 10.1109/TED.2026.3689087
- Year
- 2026
- Link
- https://ieeexplore.ieee.org/document/11513245 209회 연결