Publication

Power Semiconductor Device Technology and Reliability

2026 Stable High-Temperature Operation of Ultra-Wide Bandgap Al-rich AlGaN HFET

본문

Author
Do-Hyeong Yeo, Hyun-Seop Kim, Ho-Young Cha
Journal
Semiconductor Science and Technology
Vol./ Page
Vol. 41, No. 2, p. 025022
DOI
DOI: 10.1088/1361-6641/ae4534
Year
2026