Publication

Power Semiconductor Device Technology and Reliability

2025 P-GaN/AlGaN/GaN E-Mode HEMT with Extended MOS Gate

본문

Author
Min-Keun Lee, Gökhan Atmaca, Myeong-Su Chae, Hyungtak Kim, Hyun-Seop Kim, Ho-Young Cha
Journal
Electronics Letters
Vol./ Page
Vol. 61, No. 1, p. e70475
DOI
DOI: 10.1049/ell2.70475
Year
2025