Publication

Power Semiconductor Device Technology and Reliability

2024 Monolithic E/D-mode P-GaN/AlGaN/GaN HFETs using reactivation annealing process

본문

Author
Yeo-Reum Yang, Jun-Hyeok Yim, Hyun-Seop Kim, Ho-Young Cha
Journal
Materials Science in Semiconductor Processing
Vol./ Page
Vol. 179, p. 108483
DOI
DOI: 10.1016/j.mssp.2024.108483
Year
2024