In the development of semiconductor devices, reliability is crucial for ensuring stable, long-term performance, particularly in high-power applications. Power semiconductors, which often operate under high voltage, high efficiency, and elevated temperatures, require high reliability to withstand these demanding conditions. Research focuses on understanding the degradation mechanisms that affect device performance over time, conducting stress tests, and analyzing failure modes. The aim is to enhance the durability and operational lifespan of semiconductor devices, improving their safety and efficiency across various industries.